The main topics of the EXRS2016 conference
- Interactions of X-rays with matter and fundamental parameters
- XRS Instrumentation (X-ray sources, optics and detectors)
- Quantification methodology and metrology
- TXRF, GIXRF and related techniques
- Microbeam techniques, confocal XRF and X-Ray imaging
- Mobile and portable XRF
- Synchrotron XRS, XAFS, high resolution XES, and RIXS
- PIXE instrumentation and applications
- Electron induced XRS
- WDXRS
- X-ray diffraction (XRD)
- XRS in Art and Cultural Heritage
- XRS in Advanced Materials and Nanoscience
- XRS in Earth and Environment sciences
- XRS in Industrial Quality and Process Control
- XRS in Life Sciences and Forensics
- Recent Scientific Developments by XRS Instrumentation Manufacturers (reserved to exhibitors)